Low Resistance Measurement Methods

A low resistance measurement is typically a measurement below 1 000 ohm.

Low resistance measurement methods.

Special connecting clips called kelvin clips are made to facilitate this kind of connection across a subject resistance. In the above picture r is the unknown resistor and v is a multimeter set to read millivolts. The methods are listed below. Kelvin double bridge method.

The dc potentiometer method of measurement of resistance is used for measuring the unknown resistance of low value. Also at this level standing. Carey foster bridge method. Carey foster bridge method 3 measurement of high resistance.

What is a low resistance measurement. 2 wires carry the current known as the source or current leads and pass current through the rx. Some basic methods are suitable for low as well as medium resistances. 1 measurement of low resistance.

This is the most crude and simplest method of measuring resistance. The voltage drop across the known and unknown resistance is measured and by comparison the value of known resistance is determined. The four wire kelvin method of measurement is preferred for resistance values below 100ω and all seaward milliohmmeters and microhmmeters use this method. Following are the methods employed for measuring a resistance whose value is in the range 1ω 100kω ammeter voltmeter method.

Low resistance measurement method basically the trick is to pass a stable known amount of current through the low value resistor and measure the voltage drop across it. Ohm meter method 2 measurement of medium resistance. Kelvin method this method of measurement which avoids errors caused by wire resistance is called the kelvin or 4 wire method. The four wire kelvin method of measurement is preferred for resistance values below 100 ω and all cropico milliohmmeters and microhmmeters use this method.

These measurements are made using 4 separate wires. These measurements are made using 4 separate wires. At this level it is important to use test equipment that will minimize errors introduced by the test lead resistance and or contact resistance between the probe and the material being tested.